Our Instruments
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Available
AFM (Atomic Force Microscopy)
Multi-mode AFM with various scanning modes
Available
DC Metal Sputtering
DC magnetron sputtering for metal thin films
Available
Electrical Probe Station
Electrical measurements (PE loop, IV, CV)
Available
Furnace
Muffle and Tube furnace for annealing
Available
Hall Measurement System
Hall effect measurement system
Available
PLD (Pulsed Laser Deposition)
Multi-chamber PLD system for oxide thin film growth
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